Please use this identifier to cite or link to this item: http://inet.vidyasagar.ac.in:8080/jspui/handle/123456789/896
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dc.contributor.authorPradhan, Buddhadev
dc.contributor.authorGupta, Bhaskar
dc.date.accessioned2016-12-22T17:37:15Z-
dc.date.available2016-12-22T17:37:15Z-
dc.date.issued2014-03-27
dc.identifier.issn0972-8791
dc.identifier.urihttp://inet.vidyasagar.ac.in:8080/jspui/handle/123456789/896-
dc.description76-82en_US
dc.description.abstractEffects of residual stress on the electromechanical characteristic of a CSRRs based band reject filter are presented. Realization of such a filter has previously been reported by the authors, [1] neglecting the effect of residual stress on MEMS beam. This paper presents electromechanical simulated results as well as theoretically calculated results with consideration of residual stress effect. Residual stress performance is calculated with respect to actuation voltage and spring constant of fixed-fixed gold metallic beam. It is apparent that the effects of residual stress are quite significant which should be taken into account for all such analysisen_US
dc.language.isoen_USen_US
dc.publisherVidyasagar University , Midnapore , West-Bengal , Indiaen_US
dc.relation.ispartofseriesJournal of Physical Science;18
dc.subjectCSRRs Filteren_US
dc.subjectMEMSen_US
dc.subjectResidual Stressen_US
dc.subjectElectro- mechanical analysisen_US
dc.titleEffect of Residual Stress on CSRR Based RF MEMS Filteren_US
dc.typeArticleen_US
Appears in Collections:Journal of Physical Sciences Vol.18 [2014] - [Special Issue : Communication, Device, Information and Intelligence Systems]

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