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dc.contributor.authorGu, Xin
dc.contributor.authorShi, Yi-min
dc.identifier.issn0972-8791 (Print)
dc.description.abstractWhen the lifetimes data from the parallel system are masked and the masking probability is dependent with the failure component, we consider the reliability estimations of generalized Rayleigh components in the parallel system. Based on the given masking level and masking probability ratio, Maximum Likelihood Estimations (MLE) and Bayes estimations of parameters are obtained respectively. At last, numerical simulation demonstrates the correctness of theoretical results. We study the influence of masking level on the accuracy of the estimations, and then compare the effect of MLEs and Bayes estimations under non-informative priors and conjugate priors.en_US
dc.publisherVidyasagar University , Midnapore , West-Bengal , Indiaen_US
dc.relation.ispartofseriesJournal of Physical Science;Vol 15 [2011]
dc.subjectreliability analysisen_US
dc.subjectdependent masked dataen_US
dc.subjectBayes estimationen_US
dc.subjectgeneralized Rayleigh distributionen_US
dc.titleEstimation of Generalized Rayleigh Components Reliability in a Parallel System Using Dependent Masked Dataen_US
Appears in Collections:Journal of Physical Sciences Vol.15 [2011]

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