Please use this identifier to cite or link to this item: http://inet.vidyasagar.ac.in:8080/jspui/handle/123456789/836
Title: Estimation of Generalized Rayleigh Components Reliability in a Parallel System Using Dependent Masked Data
Authors: Gu, Xin
Shi, Yi-min
Keywords: reliability analysis
dependent masked data
MLE
Bayes estimation
generalized Rayleigh distribution
Issue Date: 2011
Publisher: Vidyasagar University , Midnapore , West-Bengal , India
Series/Report no.: Journal of Physical Science;Vol 15 [2011]
Abstract: When the lifetimes data from the parallel system are masked and the masking probability is dependent with the failure component, we consider the reliability estimations of generalized Rayleigh components in the parallel system. Based on the given masking level and masking probability ratio, Maximum Likelihood Estimations (MLE) and Bayes estimations of parameters are obtained respectively. At last, numerical simulation demonstrates the correctness of theoretical results. We study the influence of masking level on the accuracy of the estimations, and then compare the effect of MLEs and Bayes estimations under non-informative priors and conjugate priors.
Description: 33-42
URI: http://inet.vidyasagar.ac.in:8080/jspui/handle/123456789/836
ISSN: 0972-8791 (Print)
Appears in Collections:Journal of Physical Sciences Vol.15 [2011]

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