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  4. Journal of Physical Sciences Vol.13 [2009]
Please use this identifier to cite or link to this item: http://inet.vidyasagar.ac.in:8080/jspui/handle/123456789/773
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dc.contributor.authorZhang, Fan
dc.contributor.authorShi, Yi-min
dc.date.accessioned2016-12-22T17:15:57Z-
dc.date.available2016-12-22T17:15:57Z-
dc.date.issued2009
dc.identifier.issn0972-8791 (Print)
dc.identifier.urihttp://inet.vidyasagar.ac.in:8080/jspui/handle/123456789/773-
dc.description1-12en_US
dc.description.abstractBased on the masked data, the reliability of n non-independent and non-identical series system subjected to n +1sources of fatal shocks is investigated. We get the parameter estimations as well as reliability estimations by adopting Bayes approach. Also, a numerical simulation example is given to illustrate how one can utilize the method to tackle the practical problemen_US
dc.language.isoen_USen_US
dc.publisherVidyasagar University , Midnapore , West-Bengal , Indiaen_US
dc.relation.ispartofseriesJournal of Physical Science;Vol 13 [2009]
dc.subjectMasked Dataen_US
dc.subjectnon-independent systemen_US
dc.subjectBayes approachen_US
dc.subjectanalysisen_US
dc.subjectshock modelen_US
dc.titleReliability Analysis fornNon-Independent and Non-Identical Series Systems Using Masked Dataen_US
dc.typeArticleen_US
Appears in Collections:Journal of Physical Sciences Vol.13 [2009]

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